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As preexisting DC-only Testers only measure Static DC, they cannot initialize device while running Power Up Sequence or Pattern or measure current after entering certain mode. Thus, they have high possibility of Burn-Out or Over Kill in Burn-In.
AIO700 Functional DC Test System is a system developed to solve these problems and perform DC and Function Test during Sorter Index Time to screen DC and Function Fail Device in early states to minimize loss of processes.


  • Compatible with new Devices (Ci-MCP, eMMC, LPDDR-III, etc)
  • 8 DUT Test System
  • Increased Clock Pins and PPS Pins per DUT
  • Decrease in Test Time with Multi PMU on each DUT
  • Full Channel I/O
  • Full Channel Per Pin Select
  • New TPG Board (40MHz, 24X/24Y/36Data Register)
  • Multiple Input Level Control
  • Include DBM Memory for Nand Flash Device
  • Chip ID Test